%0 Conference Paper %1 conf/icecsys/MahmoudBEEAP15 %A Mahmoud, Nessim %A Barakat, Adel %A El-Hameed, Anwer S. Abd %A El-Rahman, Adel B. Abd %A Allam, Ahmed %A Pokharel, Ramesh K. %B ICECS %D 2015 %I IEEE %K dblp %P 237-239 %T Study of SiO2 thickness effect on insertion loss of CMOS 60 GHz band pass filter. %U http://dblp.uni-trier.de/db/conf/icecsys/icecsys2015.html#MahmoudBEEAP15 %@ 978-1-5090-0246-7

@inproceedings{conf/icecsys/MahmoudBEEAP15, added-at = {2019-10-19T00:00:00.000+0200}, author = {Mahmoud, Nessim and Barakat, Adel and El-Hameed, Anwer S. Abd and El-Rahman, Adel B. Abd and Allam, Ahmed and Pokharel, Ramesh K.}, biburl = {https://www.bibsonomy.org/bibtex/2e282bf84b6c4ce69c350c0e27b46d620/dblp}, booktitle = {ICECS}, crossref = {conf/icecsys/2015}, ee = {https://doi.org/10.1109/ICECS.2015.7440292}, interhash = {6ac361914439f835b7adcf1b0a1b193b}, intrahash = {e282bf84b6c4ce69c350c0e27b46d620}, isbn = {978-1-5090-0246-7}, keywords = {dblp}, pages = {237-239}, publisher = {IEEE}, timestamp = {2019-10-22T15:43:27.000+0200}, title = {Study of SiO2 thickness effect on insertion loss of CMOS 60 GHz band pass filter.}, url = {http://dblp.uni-trier.de/db/conf/icecsys/icecsys2015.html#MahmoudBEEAP15}, year = 2015 }