Effect of interface charge on the dc bias stress-induced deformation and shift of the transfer characteristic of amorphous oxide thin-film transistors.
Please log in to take part in the discussion (add own reviews or comments).
Cite this publication
More citation styles
- please select -
%0 Journal Article
%1 journals/mr/EstradaCI12
%A Estrada, Magali
%A Cerdeira, Antonio
%A Iñíguez, Benjamín
%D 2012
%J Microelectron. Reliab.
%K dblp
%N 7
%P 1342-1345
%T Effect of interface charge on the dc bias stress-induced deformation and shift of the transfer characteristic of amorphous oxide thin-film transistors.
%U http://dblp.uni-trier.de/db/journals/mr/mr52.html#EstradaCI12
%V 52
@article{journals/mr/EstradaCI12,
added-at = {2020-02-22T00:00:00.000+0100},
author = {Estrada, Magali and Cerdeira, Antonio and Iñíguez, Benjamín},
biburl = {https://www.bibsonomy.org/bibtex/2ec8a8cb63d6a2de35e246afeb8334ae9/dblp},
ee = {https://doi.org/10.1016/j.microrel.2012.02.026},
interhash = {709fd8fef4695fe1672d6a4aa6866789},
intrahash = {ec8a8cb63d6a2de35e246afeb8334ae9},
journal = {Microelectron. Reliab.},
keywords = {dblp},
number = 7,
pages = {1342-1345},
timestamp = {2020-02-25T13:25:44.000+0100},
title = {Effect of interface charge on the dc bias stress-induced deformation and shift of the transfer characteristic of amorphous oxide thin-film transistors.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr52.html#EstradaCI12},
volume = 52,
year = 2012
}
