Article,
Failure and reliability analysis of STT-MRAM.
W. Zhao, Y. Zhang, T. Devolder, J. Klein, D. Ravelosona, C. Chappert, and P. Mazoyer.Microelectron. Reliab., 52 (9-10): 1848-1852 (2012)
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- article
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- 2012
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- Microelectron. Reliab.
- number
- 9-10
- pages
- 1848-1852
- volume
- 52
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- https://www.wikidata.org/entity/Q59658557
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- please select -%0 Journal Article
%1 journals/mr/ZhaoZDKRCM12
%A Zhao, Weisheng
%A Zhang, Yue
%A Devolder, Thibaut
%A Klein, Jacques-Olivier
%A Ravelosona, Dafine
%A Chappert, Claude
%A Mazoyer, Pascale
%D 2012
%J Microelectron. Reliab.
%K dblp
%N 9-10
%P 1848-1852
%T Failure and reliability analysis of STT-MRAM.
%U http://dblp.uni-trier.de/db/journals/mr/mr52.html#ZhaoZDKRCM12
%V 52
@article{journals/mr/ZhaoZDKRCM12,
added-at = {2022-10-02T00:00:00.000+0200},
author = {Zhao, Weisheng and Zhang, Yue and Devolder, Thibaut and Klein, Jacques-Olivier and Ravelosona, Dafine and Chappert, Claude and Mazoyer, Pascale},
biburl = {https://www.bibsonomy.org/bibtex/25e9f219f8c3f7768aaab8e75111d0b04/dblp},
ee = {https://www.wikidata.org/entity/Q59658557},
interhash = {70b4a18df373a3aaf77d8f06573a2b19},
intrahash = {5e9f219f8c3f7768aaab8e75111d0b04},
journal = {Microelectron. Reliab.},
keywords = {dblp},
number = {9-10},
pages = {1848-1852},
timestamp = {2024-04-09T02:49:59.000+0200},
title = {Failure and reliability analysis of STT-MRAM.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr52.html#ZhaoZDKRCM12},
volume = 52,
year = 2012
}