%0 Journal Article %1 journals/ijig/NgLCFL09 %A Ng, Ada N. Y. %A Lam, Edmund Y. %A Chung, Ronald %A Fung, Kenneth S. M. %A Leung, W. H. %D 2009 %J Int. J. Image Graph. %K dblp %N 1 %P 133-152 %T Reference-Free Machine Vision Inspection of semiconductor die Images. %U http://dblp.uni-trier.de/db/journals/ijig/ijig9.html#NgLCFL09 %V 9

@article{journals/ijig/NgLCFL09, added-at = {2020-03-24T00:00:00.000+0100}, author = {Ng, Ada N. Y. and Lam, Edmund Y. and Chung, Ronald and Fung, Kenneth S. M. and Leung, W. H.}, biburl = {https://www.bibsonomy.org/bibtex/2f871931e0d2e53bc95e3a4eec7c07e87/dblp}, ee = {https://doi.org/10.1142/S021946780900337X}, interhash = {70c464de9153c622e3285b708893aa2f}, intrahash = {f871931e0d2e53bc95e3a4eec7c07e87}, journal = {Int. J. Image Graph.}, keywords = {dblp}, number = 1, pages = {133-152}, timestamp = {2020-03-25T11:41:21.000+0100}, title = {Reference-Free Machine Vision Inspection of semiconductor die Images.}, url = {http://dblp.uni-trier.de/db/journals/ijig/ijig9.html#NgLCFL09}, volume = 9, year = 2009 }