%0 Journal Article %1 journals/mr/Martin-MartinezRNAS07 %A Martín-Martínez, Javier %A Rodríguez, Rosana %A Nafría, Montserrat %A Aymerich, Xavier %A Stathis, James H. %D 2007 %J Microelectron. Reliab. %K dblp %N 4-5 %P 665-668 %T Worn-out oxide MOSFET characteristics: Role of gate current and device parameters on a current mirror. %U http://dblp.uni-trier.de/db/journals/mr/mr47.html#Martin-MartinezRNAS07 %V 47

@article{journals/mr/Martin-MartinezRNAS07, added-at = {2020-02-22T00:00:00.000+0100}, author = {Martín-Martínez, Javier and Rodríguez, Rosana and Nafría, Montserrat and Aymerich, Xavier and Stathis, James H.}, biburl = {https://www.bibsonomy.org/bibtex/2def68aaa110297cd4059657b071d7ea7/dblp}, ee = {https://doi.org/10.1016/j.microrel.2007.01.035}, interhash = {727bed0e463d5495f8f9f6da98c95be1}, intrahash = {def68aaa110297cd4059657b071d7ea7}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {4-5}, pages = {665-668}, timestamp = {2020-02-25T13:25:15.000+0100}, title = {Worn-out oxide MOSFET characteristics: Role of gate current and device parameters on a current mirror.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr47.html#Martin-MartinezRNAS07}, volume = 47, year = 2007 }