%0 Conference Paper %1 conf/itc/SavirM86 %A Savir, Jacob %A McAnney, William H. %B ITC %D 1986 %I IEEE Computer Society %K dblp %P 263-273 %T Random Pattern Testability of Delay Faults. %U http://dblp.uni-trier.de/db/conf/itc/itc1986.html#SavirM86

@inproceedings{conf/itc/SavirM86, added-at = {2002-10-22T00:00:00.000+0200}, author = {Savir, Jacob and McAnney, William H.}, biburl = {https://www.bibsonomy.org/bibtex/2393bdb1e0549d0b357938dae5a5009cb/dblp}, booktitle = {ITC}, crossref = {conf/itc/1986}, date = {2002-10-22}, description = {dblp}, interhash = {74211c92633fb5862cb61319ce53bfe5}, intrahash = {393bdb1e0549d0b357938dae5a5009cb}, keywords = {dblp}, pages = {263-273}, publisher = {IEEE Computer Society}, timestamp = {2002-10-22T00:00:00.000+0200}, title = {Random Pattern Testability of Delay Faults.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1986.html#SavirM86}, year = 1986 }