Inproceedings,
NBTI Impact of Surface Orientation in Stacked Gate-All-Around Nanosheet Transistor.
H. Zhou, M. Wang, J. Zhang, K. Watanabe, C. Durfee, S. Mochizuki, R. Bao, R. Southwick, M. Bhuiyan, and B. Veeraraghavan.IRPS, page 1-6. IEEE, (2020)
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- BibTeX key
- conf/irps/ZhouWZWDMBSBV20
- entry type
- inproceedings
- booktitle
- IRPS
- year
- 2020
- pages
- 1-6
- publisher
- IEEE
- crossref
- conf/irps/2020
- ee
- https://doi.org/10.1109/IRPS45951.2020.9129023
- isbn
- 978-1-7281-3199-3
- url
- http://dblp.uni-trier.de/db/conf/irps/irps2020.html#ZhouWZWDMBSBV20
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- please select -%0 Conference Paper
%1 conf/irps/ZhouWZWDMBSBV20
%A Zhou, Huimei
%A Wang, Miaomiao
%A Zhang, Jingyun
%A Watanabe, Koji
%A Durfee, Curtis
%A Mochizuki, Shogo
%A Bao, Ruqiang
%A Southwick, Richard G.
%A Bhuiyan, Maruf
%A Veeraraghavan, Basker
%B IRPS
%D 2020
%I IEEE
%K dblp
%P 1-6
%T NBTI Impact of Surface Orientation in Stacked Gate-All-Around Nanosheet Transistor.
%U http://dblp.uni-trier.de/db/conf/irps/irps2020.html#ZhouWZWDMBSBV20
%@ 978-1-7281-3199-3
@inproceedings{conf/irps/ZhouWZWDMBSBV20,
added-at = {2023-06-28T00:00:00.000+0200},
author = {Zhou, Huimei and Wang, Miaomiao and Zhang, Jingyun and Watanabe, Koji and Durfee, Curtis and Mochizuki, Shogo and Bao, Ruqiang and Southwick, Richard G. and Bhuiyan, Maruf and Veeraraghavan, Basker},
biburl = {https://www.bibsonomy.org/bibtex/274c9cd7a0c37255af40fb207cefbda9c/dblp},
booktitle = {IRPS},
crossref = {conf/irps/2020},
ee = {https://doi.org/10.1109/IRPS45951.2020.9129023},
interhash = {75596c719974a4bb76cf2d8f1f8cca54},
intrahash = {74c9cd7a0c37255af40fb207cefbda9c},
isbn = {978-1-7281-3199-3},
keywords = {dblp},
pages = {1-6},
publisher = {IEEE},
timestamp = {2024-04-10T16:56:46.000+0200},
title = {NBTI Impact of Surface Orientation in Stacked Gate-All-Around Nanosheet Transistor.},
url = {http://dblp.uni-trier.de/db/conf/irps/irps2020.html#ZhouWZWDMBSBV20},
year = 2020
}