%0 Journal Article %1 journals/ieicet/InoueHF10 %A Inoue, Ryoichi %A Hosokawa, Toshinori %A Fujiwara, Hideo %D 2010 %J IEICE Trans. Inf. Syst. %K dblp %N 1 %P 24-32 %T A Fault Dependent Test Generation Method for State-Observable FSMs to Increase Defect Coverage under the Test Length Constraint. %U http://dblp.uni-trier.de/db/journals/ieicet/ieicet93d.html#InoueHF10 %V 93-D

@article{journals/ieicet/InoueHF10, added-at = {2020-04-11T00:00:00.000+0200}, author = {Inoue, Ryoichi and Hosokawa, Toshinori and Fujiwara, Hideo}, biburl = {https://www.bibsonomy.org/bibtex/2945d060343e43a41f3bc6e9fd6aeac8e/dblp}, ee = {http://search.ieice.org/bin/summary.php?id=e93-d_1_24}, interhash = {758433762044f7e6b73063587ca1ca2e}, intrahash = {945d060343e43a41f3bc6e9fd6aeac8e}, journal = {IEICE Trans. Inf. Syst.}, keywords = {dblp}, number = 1, pages = {24-32}, timestamp = {2020-04-14T11:42:21.000+0200}, title = {A Fault Dependent Test Generation Method for State-Observable FSMs to Increase Defect Coverage under the Test Length Constraint.}, url = {http://dblp.uni-trier.de/db/journals/ieicet/ieicet93d.html#InoueHF10}, volume = {93-D}, year = 2010 }