%0 Journal Article %1 journals/mr/AnandanNM14 %A Anandan, P. %A Nithya, A. %A Mohankumar, N. %D 2014 %J Microelectron. Reliab. %K dblp %N 12 %P 2723-2727 %T Simulation of flicker noise in gate-all-around Silicon Nanowire MOSFETs including interface traps. %U http://dblp.uni-trier.de/db/journals/mr/mr54.html#AnandanNM14 %V 54

@article{journals/mr/AnandanNM14, added-at = {2021-08-02T00:00:00.000+0200}, author = {Anandan, P. and Nithya, A. and Mohankumar, N.}, biburl = {https://www.bibsonomy.org/bibtex/28fc625fdf0f2e85305e956df457c07cb/dblp}, ee = {https://doi.org/10.1016/j.microrel.2014.07.145}, interhash = {75c218a7fbd88ce852b1565993110b24}, intrahash = {8fc625fdf0f2e85305e956df457c07cb}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 12, pages = {2723-2727}, timestamp = {2024-04-09T02:50:51.000+0200}, title = {Simulation of flicker noise in gate-all-around Silicon Nanowire MOSFETs including interface traps.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr54.html#AnandanNM14}, volume = 54, year = 2014 }