%0 Conference Paper %1 conf/irps/ZhouWBSWSZBG21 %A Zhou, Huimei %A Wang, Miaomiao %A Bao, Ruqiang %A Shen, Tian %A Wu, Ernest Y. %A Southwick, Richard G. %A Zhang, Jingyun %A Basker, Veeraraghavan S. %A Guo, Dechao %B IRPS %D 2021 %I IEEE %K dblp %P 1-6 %T TDDB Reliability in Gate-All-Around Nanosheet. %U http://dblp.uni-trier.de/db/conf/irps/irps2021.html#ZhouWBSWSZBG21 %@ 978-1-7281-6893-7

@inproceedings{conf/irps/ZhouWBSWSZBG21, added-at = {2023-06-28T00:00:00.000+0200}, author = {Zhou, Huimei and Wang, Miaomiao and Bao, Ruqiang and Shen, Tian and Wu, Ernest Y. and Southwick, Richard G. and Zhang, Jingyun and Basker, Veeraraghavan S. and Guo, Dechao}, biburl = {https://www.bibsonomy.org/bibtex/2add04485ca6ae6d1124a6f05869934ba/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2021}, ee = {https://doi.org/10.1109/IRPS46558.2021.9405204}, interhash = {7683f3fb5f199158df992721bece5643}, intrahash = {add04485ca6ae6d1124a6f05869934ba}, isbn = {978-1-7281-6893-7}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE}, timestamp = {2024-04-09T12:18:55.000+0200}, title = {TDDB Reliability in Gate-All-Around Nanosheet.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2021.html#ZhouWBSWSZBG21}, year = 2021 }