%0 Journal Article %1 journals/mr/DowneyMCF10 %A Downey, Brian P. %A Mohney, Suzanne E. %A Clark, Trevor E. %A Flemish, Joseph R. %D 2010 %J Microelectron. Reliab. %K dblp %N 12 %P 1967-1972 %T Reliability of aluminum-bearing ohmic contacts to SiC under high current density. %U http://dblp.uni-trier.de/db/journals/mr/mr50.html#DowneyMCF10 %V 50

@article{journals/mr/DowneyMCF10, added-at = {2020-02-22T00:00:00.000+0100}, author = {Downey, Brian P. and Mohney, Suzanne E. and Clark, Trevor E. and Flemish, Joseph R.}, biburl = {https://www.bibsonomy.org/bibtex/2311740ac40758e8e7125132c5ec9727c/dblp}, ee = {https://doi.org/10.1016/j.microrel.2010.07.007}, interhash = {7a5929dc9d611097f74b25e47e356e6c}, intrahash = {311740ac40758e8e7125132c5ec9727c}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 12, pages = {1967-1972}, timestamp = {2020-02-25T13:27:10.000+0100}, title = {Reliability of aluminum-bearing ohmic contacts to SiC under high current density.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr50.html#DowneyMCF10}, volume = 50, year = 2010 }