%0 Conference Paper %1 conf/vts/ParkNKMW94 %A Park, Jaehong %A Naivar, Mark %A Kapur, Rohit %A Mercer, M. Ray %A Williams, Thomas W. %B VTS %D 1994 %I IEEE Computer Society %K dblp %P 186-191 %T Limitations in predicting defect level based on stuck-at fault coverage. %U http://dblp.uni-trier.de/db/conf/vts/vts1994.html#ParkNKMW94 %@ 0-8186-5440-6

@inproceedings{conf/vts/ParkNKMW94, added-at = {2023-03-24T00:00:00.000+0100}, author = {Park, Jaehong and Naivar, Mark and Kapur, Rohit and Mercer, M. Ray and Williams, Thomas W.}, biburl = {https://www.bibsonomy.org/bibtex/225505589679d2f2964b162de50f2f262/dblp}, booktitle = {VTS}, crossref = {conf/vts/1994}, ee = {https://doi.ieeecomputersociety.org/10.1109/VTEST.1994.292315}, interhash = {7afe9b072b2aecd4bcd5c59fd6aa4393}, intrahash = {25505589679d2f2964b162de50f2f262}, isbn = {0-8186-5440-6}, keywords = {dblp}, pages = {186-191}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T07:35:27.000+0200}, title = {Limitations in predicting defect level based on stuck-at fault coverage.}, url = {http://dblp.uni-trier.de/db/conf/vts/vts1994.html#ParkNKMW94}, year = 1994 }