%0 Journal Article %1 journals/mr/ChenPR01 %A Chen, X. Y. %A Pedersen, A. %A van Rheenen, A. D. %D 2001 %J Microelectron. Reliab. %K dblp %N 1 %P 105-110 %T Effect of electrical and thermal stress on low-frequency noise characteristics of laser diodes. %U http://dblp.uni-trier.de/db/journals/mr/mr41.html#ChenPR01 %V 41

@article{journals/mr/ChenPR01, added-at = {2020-02-22T00:00:00.000+0100}, author = {Chen, X. Y. and Pedersen, A. and van Rheenen, A. D.}, biburl = {https://www.bibsonomy.org/bibtex/2bb2fd7387b4d7cc110a21f8eefba09c8/dblp}, ee = {https://doi.org/10.1016/S0026-2714(00)00201-8}, interhash = {7fd2fa6b2028cef6e9fd52d1884988f8}, intrahash = {bb2fd7387b4d7cc110a21f8eefba09c8}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 1, pages = {105-110}, timestamp = {2020-02-25T13:26:06.000+0100}, title = {Effect of electrical and thermal stress on low-frequency noise characteristics of laser diodes.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr41.html#ChenPR01}, volume = 41, year = 2001 }