%0 Conference Paper %1 conf/ats/InoueGF00 %A Inoue, Michiko %A Gizdarski, Emil %A Fujiwara, Hideo %B Asian Test Symposium %D 2000 %I IEEE Computer Society %K dblp %P 398-403 %T A class of sequential circuits with combinational test generation complexity under single-fault assumption. %U http://dblp.uni-trier.de/db/conf/ats/ats2000.html#InoueGF00 %@ 0-7695-0887-1

@inproceedings{conf/ats/InoueGF00, added-at = {2023-03-24T00:00:00.000+0100}, author = {Inoue, Michiko and Gizdarski, Emil and Fujiwara, Hideo}, biburl = {https://www.bibsonomy.org/bibtex/278d00f22ddcf41d0c83d065f18c0d26b/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2000}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2000.893656}, interhash = {81098db2ab45cf424ad3c52405a69201}, intrahash = {78d00f22ddcf41d0c83d065f18c0d26b}, isbn = {0-7695-0887-1}, keywords = {dblp}, pages = {398-403}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:35:42.000+0200}, title = {A class of sequential circuits with combinational test generation complexity under single-fault assumption.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2000.html#InoueGF00}, year = 2000 }