%0 Journal Article %1 journals/mr/LiaoTS09 %A Liao, Jie %A Tan, Cher Ming %A Spierings, Geert %D 2009 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1038-1043 %T Behavior of hot carrier generation in power SOI LDNMOS with shallow trench isolation (STI). %U http://dblp.uni-trier.de/db/journals/mr/mr49.html#LiaoTS09 %V 49

@article{journals/mr/LiaoTS09, added-at = {2020-02-22T00:00:00.000+0100}, author = {Liao, Jie and Tan, Cher Ming and Spierings, Geert}, biburl = {https://www.bibsonomy.org/bibtex/24ab3f0cf825f795cef2b8698faed6259/dblp}, ee = {https://doi.org/10.1016/j.microrel.2009.06.044}, interhash = {881ebb1da7a4f33351199b09436f160a}, intrahash = {4ab3f0cf825f795cef2b8698faed6259}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1038-1043}, timestamp = {2020-02-25T13:27:02.000+0100}, title = {Behavior of hot carrier generation in power SOI LDNMOS with shallow trench isolation (STI).}, url = {http://dblp.uni-trier.de/db/journals/mr/mr49.html#LiaoTS09}, volume = 49, year = 2009 }