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%0 Journal Article
%1 journals/mr/LiaoTS09
%A Liao, Jie
%A Tan, Cher Ming
%A Spierings, Geert
%D 2009
%J Microelectron. Reliab.
%K dblp
%N 9-11
%P 1038-1043
%T Behavior of hot carrier generation in power SOI LDNMOS with shallow trench isolation (STI).
%U http://dblp.uni-trier.de/db/journals/mr/mr49.html#LiaoTS09
%V 49
@article{journals/mr/LiaoTS09,
added-at = {2020-02-22T00:00:00.000+0100},
author = {Liao, Jie and Tan, Cher Ming and Spierings, Geert},
biburl = {https://www.bibsonomy.org/bibtex/24ab3f0cf825f795cef2b8698faed6259/dblp},
ee = {https://doi.org/10.1016/j.microrel.2009.06.044},
interhash = {881ebb1da7a4f33351199b09436f160a},
intrahash = {4ab3f0cf825f795cef2b8698faed6259},
journal = {Microelectron. Reliab.},
keywords = {dblp},
number = {9-11},
pages = {1038-1043},
timestamp = {2020-02-25T13:27:02.000+0100},
title = {Behavior of hot carrier generation in power SOI LDNMOS with shallow trench isolation (STI).},
url = {http://dblp.uni-trier.de/db/journals/mr/mr49.html#LiaoTS09},
volume = 49,
year = 2009
}