%0 Conference Paper %1 conf/itc/MittalLNB16 %A Mittal, Soumya %A Liu, Zeye %A Niewenhuis, Ben %A Blanton, R. D. (Shawn) %B ITC %D 2016 %I IEEE %K dblp %P 1-8 %T Test chip design for optimal cell-aware diagnosability. %U http://dblp.uni-trier.de/db/conf/itc/itc2016.html#MittalLNB16 %@ 978-1-4673-8773-6

@inproceedings{conf/itc/MittalLNB16, added-at = {2020-02-24T00:00:00.000+0100}, author = {Mittal, Soumya and Liu, Zeye and Niewenhuis, Ben and Blanton, R. D. (Shawn)}, biburl = {https://www.bibsonomy.org/bibtex/24ee7545a42bf8c2a01a71fcc80ed6d4f/dblp}, booktitle = {ITC}, crossref = {conf/itc/2016}, ee = {https://doi.org/10.1109/TEST.2016.7805850}, interhash = {884ecfe956800a99347f4a429dfa7cc0}, intrahash = {4ee7545a42bf8c2a01a71fcc80ed6d4f}, isbn = {978-1-4673-8773-6}, keywords = {dblp}, pages = {1-8}, publisher = {IEEE}, timestamp = {2020-02-25T14:23:40.000+0100}, title = {Test chip design for optimal cell-aware diagnosability.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2016.html#MittalLNB16}, year = 2016 }