%0 Book %1 series/lnee/KrishnaswamyMH13 %A Krishnaswamy, Smita %A Markov, Igor L. %A Hayes, John P. %B Lecture Notes in Electrical Engineering %D 2013 %I Springer %K dblp %P 1-120 %T Design, Analysis and Test of Logic Circuits Under Uncertainty %U http://dx.doi.org/10.1007/978-90-481-9644-9 %V 115 %@ 978-90-481-9643-2

@book{series/lnee/KrishnaswamyMH13, added-at = {2012-09-24T00:00:00.000+0200}, author = {Krishnaswamy, Smita and Markov, Igor L. and Hayes, John P.}, biburl = {https://www.bibsonomy.org/bibtex/255b6a2017744f239d05e1a33750389a5/dblp}, ee = {http://dx.doi.org/10.1007/978-90-481-9644-9}, interhash = {893871a19d6684db9b63d1d8fd7a106f}, intrahash = {55b6a2017744f239d05e1a33750389a5}, isbn = {978-90-481-9643-2}, keywords = {dblp}, pages = {1-120}, publisher = {Springer}, series = {Lecture Notes in Electrical Engineering}, timestamp = {2012-09-25T11:38:51.000+0200}, title = {Design, Analysis and Test of Logic Circuits Under Uncertainty}, url = {http://dx.doi.org/10.1007/978-90-481-9644-9}, volume = 115, year = 2013 }