%0 Conference Paper %1 conf/itc/SodenFH90 %A Soden, Jerry M. %A Fritzemeier, Ronald R. %A Hawkins, Charles F. %B ITC %D 1990 %I IEEE Computer Society %K dblp %P 255-256 %T Zero defects or zero stuck-at faults-CMOS IC process improvement with IDDQ. %U http://dblp.uni-trier.de/db/conf/itc/itc1990.html#SodenFH90 %@ 0-8186-9064-X

@inproceedings{conf/itc/SodenFH90, added-at = {2023-03-23T00:00:00.000+0100}, author = {Soden, Jerry M. and Fritzemeier, Ronald R. and Hawkins, Charles F.}, biburl = {https://www.bibsonomy.org/bibtex/2193b76bd7154eff7ef07bcf8c0c53173/dblp}, booktitle = {ITC}, crossref = {conf/itc/1990}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.1990.114026}, interhash = {8afcedd7dbdd6e925a5f7460e5550c45}, intrahash = {193b76bd7154eff7ef07bcf8c0c53173}, isbn = {0-8186-9064-X}, keywords = {dblp}, pages = {255-256}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T19:52:40.000+0200}, title = {Zero defects or zero stuck-at faults-CMOS IC process improvement with IDDQ.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1990.html#SodenFH90}, year = 1990 }