Please log in to take part in the discussion (add own reviews or comments).
Cite this publication
More citation styles
- please select -
%0 Journal Article
%1 journals/access/ParkKKKYL21
%A Park, Jin Hyo
%A Kim, Geon
%A Kim, Dong Yeong
%A Kim, Su Yeon
%A Yoo, Sunyong
%A Lee, Myoung Jin
%D 2021
%J IEEE Access
%K dblp
%P 111567-111575
%T S-TAT Leakage Current in Partial Isolation Type Saddle-FinFET (Pi-FinFET)s.
%U http://dblp.uni-trier.de/db/journals/access/access9.html#ParkKKKYL21
%V 9
@article{journals/access/ParkKKKYL21,
added-at = {2022-06-23T00:00:00.000+0200},
author = {Park, Jin Hyo and Kim, Geon and Kim, Dong Yeong and Kim, Su Yeon and Yoo, Sunyong and Lee, Myoung Jin},
biburl = {https://www.bibsonomy.org/bibtex/2854a8888695667e699ff29c57ebd2eb1/dblp},
ee = {https://doi.org/10.1109/ACCESS.2021.3102687},
interhash = {8bfbf6d112ef5e460ce9a5f27f15fd8c},
intrahash = {854a8888695667e699ff29c57ebd2eb1},
journal = {IEEE Access},
keywords = {dblp},
pages = {111567-111575},
timestamp = {2024-04-08T13:56:26.000+0200},
title = {S-TAT Leakage Current in Partial Isolation Type Saddle-FinFET (Pi-FinFET)s.},
url = {http://dblp.uni-trier.de/db/journals/access/access9.html#ParkKKKYL21},
volume = 9,
year = 2021
}