%0 Journal Article %1 journals/tvlsi/SuHWLW11 %A Su, Chin-Lung %A Huang, Rei-Fu %A Wu, Cheng-Wen %A Luo, Kun-Lun %A Wu, Wen Ching %D 2011 %J IEEE Trans. Very Large Scale Integr. Syst. %K dblp %N 12 %P 2184-2194 %T A Built-in Self-Diagnosis and Repair Design With Fail Pattern Identification for Memories. %U http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi19.html#SuHWLW11 %V 19

@article{journals/tvlsi/SuHWLW11, added-at = {2023-09-30T00:00:00.000+0200}, author = {Su, Chin-Lung and Huang, Rei-Fu and Wu, Cheng-Wen and Luo, Kun-Lun and Wu, Wen Ching}, biburl = {https://www.bibsonomy.org/bibtex/299d51e03f87a60df50feb215a9ab2a78/dblp}, ee = {https://doi.org/10.1109/TVLSI.2010.2073489}, interhash = {8c0bf1b5812b3c474fc9677d43a179ac}, intrahash = {99d51e03f87a60df50feb215a9ab2a78}, journal = {IEEE Trans. Very Large Scale Integr. Syst.}, keywords = {dblp}, number = 12, pages = {2184-2194}, timestamp = {2024-04-08T14:32:31.000+0200}, title = {A Built-in Self-Diagnosis and Repair Design With Fail Pattern Identification for Memories.}, url = {http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi19.html#SuHWLW11}, volume = 19, year = 2011 }