%0 Journal Article %1 journals/mr/StathisZ06 %A Stathis, James H. %A Zafar, Sufi %D 2006 %J Microelectron. Reliab. %K dblp %N 2-4 %P 270-286 %T The negative bias temperature instability in MOS devices: A review. %U http://dblp.uni-trier.de/db/journals/mr/mr46.html#StathisZ06 %V 46

@article{journals/mr/StathisZ06, added-at = {2020-02-22T00:00:00.000+0100}, author = {Stathis, James H. and Zafar, Sufi}, biburl = {https://www.bibsonomy.org/bibtex/2ed0b83dd3dd03dacd8521ba5332eb62b/dblp}, ee = {https://doi.org/10.1016/j.microrel.2005.08.001}, interhash = {93dda883b952012b5fc18d5755af02e5}, intrahash = {ed0b83dd3dd03dacd8521ba5332eb62b}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {2-4}, pages = {270-286}, timestamp = {2020-02-25T13:27:55.000+0100}, title = {The negative bias temperature instability in MOS devices: A review.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr46.html#StathisZ06}, volume = 46, year = 2006 }