%0 Journal Article %1 journals/et/Serrano-CasesRC20 %A Serrano-Cases, Alejandro %A Restrepo-Calle, Felipe %A Cuenca-Asensi, Sergio %A Martínez-Álvarez, Antonio %D 2020 %J J. Electron. Test. %K dblp %N 1 %P 47-57 %T Multi-Threaded Mitigation of Radiation-Induced Soft Errors in Bare-Metal Embedded Systems. %U http://dblp.uni-trier.de/db/journals/et/et36.html#Serrano-CasesRC20 %V 36

@article{journals/et/Serrano-CasesRC20, added-at = {2020-09-11T00:00:00.000+0200}, author = {Serrano-Cases, Alejandro and Restrepo-Calle, Felipe and Cuenca-Asensi, Sergio and Martínez-Álvarez, Antonio}, biburl = {https://www.bibsonomy.org/bibtex/219bd28a695a3df03a9ae6debe4b9174d/dblp}, ee = {https://doi.org/10.1007/s10836-019-05846-4}, interhash = {9410fad523b7fc4c8e0721d064d1ebdd}, intrahash = {19bd28a695a3df03a9ae6debe4b9174d}, journal = {J. Electron. Test.}, keywords = {dblp}, number = 1, pages = {47-57}, timestamp = {2020-09-12T11:40:33.000+0200}, title = {Multi-Threaded Mitigation of Radiation-Induced Soft Errors in Bare-Metal Embedded Systems.}, url = {http://dblp.uni-trier.de/db/journals/et/et36.html#Serrano-CasesRC20}, volume = 36, year = 2020 }