%0 Journal Article %1 journals/tim/ZhangAKKF15 %A Zhang, Lulu %A Azuma, Yasushi %A Kurokawa, Akira %A Kuramoto, Naoki %A Fujii, Kenichi %D 2015 %J IEEE Trans. Instrumentation and Measurement %K dblp %N 6 %P 1509-1513 %T Surface Layer Analysis of Si Sphere by XRF and XPS. %U http://dblp.uni-trier.de/db/journals/tim/tim64.html#ZhangAKKF15 %V 64

@article{journals/tim/ZhangAKKF15, added-at = {2019-09-16T00:00:00.000+0200}, author = {Zhang, Lulu and Azuma, Yasushi and Kurokawa, Akira and Kuramoto, Naoki and Fujii, Kenichi}, biburl = {https://www.bibsonomy.org/bibtex/2ea887400c2f06cf36e2854b99cc6b28e/dblp}, ee = {https://doi.org/10.1109/TIM.2015.2389352}, interhash = {95e4077ef32b35c077e5f8929a402ddb}, intrahash = {ea887400c2f06cf36e2854b99cc6b28e}, journal = {IEEE Trans. Instrumentation and Measurement}, keywords = {dblp}, number = 6, pages = {1509-1513}, timestamp = {2019-09-17T11:44:24.000+0200}, title = {Surface Layer Analysis of Si Sphere by XRF and XPS.}, url = {http://dblp.uni-trier.de/db/journals/tim/tim64.html#ZhangAKKF15}, volume = 64, year = 2015 }