%0 Conference Paper %1 conf/ats/MiyazakiHDMF03 %A Miyazaki, Masahide %A Hosokawa, Toshinori %A Date, Hiroshi %A Muraoka, Michiaki %A Fujiwara, Hideo %B Asian Test Symposium %D 2003 %I IEEE Computer Society %K dblp %P 412-417 %T A DFT Selection Method for Reducing Test Application Time of System-on-Chips. %U http://dblp.uni-trier.de/db/conf/ats/ats2003.html#MiyazakiHDMF03 %@ 0-7695-1951-2

@inproceedings{conf/ats/MiyazakiHDMF03, added-at = {2023-03-24T00:00:00.000+0100}, author = {Miyazaki, Masahide and Hosokawa, Toshinori and Date, Hiroshi and Muraoka, Michiaki and Fujiwara, Hideo}, biburl = {https://www.bibsonomy.org/bibtex/27a60b9776e44647c1bf14cd8210aa480/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2003}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2003.1250847}, interhash = {96e3ba8debd3a7c2fda9fa1cac1ac865}, intrahash = {7a60b9776e44647c1bf14cd8210aa480}, isbn = {0-7695-1951-2}, keywords = {dblp}, pages = {412-417}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:35:36.000+0200}, title = {A DFT Selection Method for Reducing Test Application Time of System-on-Chips.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2003.html#MiyazakiHDMF03}, year = 2003 }