%0 Journal Article %1 journals/tcas/MakinoNSMMYIM11 %A Makino, Hiroshi %A Nakata, Shunji %A Suzuki, Hirotsugu %A Mutoh, Shin'ichiro %A Miyama, Masayuki %A Yoshimura, Tsutomu %A Iwade, Shuhei %A Matsuda, Yoshio %D 2011 %J IEEE Trans. Circuits Syst. II Express Briefs %K dblp %N 4 %P 230-234 %T Reexamination of SRAM Cell Write Margin Definitions in View of Predicting the Distribution. %U http://dblp.uni-trier.de/db/journals/tcas/tcasII58.html#MakinoNSMMYIM11 %V 58-II

@article{journals/tcas/MakinoNSMMYIM11, added-at = {2020-05-27T00:00:00.000+0200}, author = {Makino, Hiroshi and Nakata, Shunji and Suzuki, Hirotsugu and Mutoh, Shin'ichiro and Miyama, Masayuki and Yoshimura, Tsutomu and Iwade, Shuhei and Matsuda, Yoshio}, biburl = {https://www.bibsonomy.org/bibtex/2dbaaef7fa37cc2c29e751a9fa6a44e6c/dblp}, ee = {https://doi.org/10.1109/TCSII.2011.2124531}, interhash = {96ea2e30dba5709e9854b60b39876145}, intrahash = {dbaaef7fa37cc2c29e751a9fa6a44e6c}, journal = {IEEE Trans. Circuits Syst. II Express Briefs}, keywords = {dblp}, number = 4, pages = {230-234}, timestamp = {2020-05-28T11:55:05.000+0200}, title = {Reexamination of SRAM Cell Write Margin Definitions in View of Predicting the Distribution.}, url = {http://dblp.uni-trier.de/db/journals/tcas/tcasII58.html#MakinoNSMMYIM11}, volume = {58-II}, year = 2011 }