%0 Journal Article %1 journals/mr/TsukudaAHNO18 %A Tsukuda, Masanori %A Abe, Seiya %A Hasegawa, Kazunori %A Ninomiya, Tamotsu %A Omura, Ichiro %D 2018 %J Microelectron. Reliab. %K dblp %P 482-485 %T Bias voltage criteria of gate shielding effect for protecting IGBTs from shoot-through phenomena. %U http://dblp.uni-trier.de/db/journals/mr/mr88.html#TsukudaAHNO18 %V 88-90

@article{journals/mr/TsukudaAHNO18, added-at = {2020-02-22T00:00:00.000+0100}, author = {Tsukuda, Masanori and Abe, Seiya and Hasegawa, Kazunori and Ninomiya, Tamotsu and Omura, Ichiro}, biburl = {https://www.bibsonomy.org/bibtex/2a1d057afbd99198312e9e5bdaf72899b/dblp}, ee = {https://doi.org/10.1016/j.microrel.2018.06.026}, interhash = {98584c2f4990753d238a1ce6e9e97d04}, intrahash = {a1d057afbd99198312e9e5bdaf72899b}, journal = {Microelectron. Reliab.}, keywords = {dblp}, pages = {482-485}, timestamp = {2020-02-25T13:27:39.000+0100}, title = {Bias voltage criteria of gate shielding effect for protecting IGBTs from shoot-through phenomena.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr88.html#TsukudaAHNO18}, volume = {88-90}, year = 2018 }