%0 Conference Paper %1 conf/dac/MinS82 %A Min, Yinghua %A Su, Stephen Y. H. %B DAC %D 1982 %E Crabbe, James S. %E Radke, Charles E. %E Ofek, Hillel %I ACM/IEEE %K dblp %P 384-392 %T Testing functional faults in VLSI. %U http://dblp.uni-trier.de/db/conf/dac/dac1982.html#MinS82

@inproceedings{conf/dac/MinS82, added-at = {2018-11-06T00:00:00.000+0100}, author = {Min, Yinghua and Su, Stephen Y. H.}, biburl = {https://www.bibsonomy.org/bibtex/27068f2c7f19f90b887edd13b072d4d34/dblp}, booktitle = {DAC}, crossref = {conf/dac/1982}, editor = {Crabbe, James S. and Radke, Charles E. and Ofek, Hillel}, ee = {https://doi.org/10.1145/800263.809234}, interhash = {9a01fc37ba3a54795390b0c735905267}, intrahash = {7068f2c7f19f90b887edd13b072d4d34}, keywords = {dblp}, pages = {384-392}, publisher = {ACM/IEEE}, timestamp = {2018-11-07T16:14:07.000+0100}, title = {Testing functional faults in VLSI.}, url = {http://dblp.uni-trier.de/db/conf/dac/dac1982.html#MinS82}, year = 1982 }