A 325F2 Physical Unclonable Function Based on Contact Failure Probability With Bit Error Rate < 0.43 ppm After Preselection With 0.0177% Discard Ratio.
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%0 Journal Article
%1 journals/jssc/JeonLKC23
%A Jeon, Duhyun
%A Lee, Dongmin
%A Kim, Dong Kyue
%A Choi, Byong-Deok
%D 2023
%J IEEE J. Solid State Circuits
%K dblp
%N 4
%P 1185-1196
%T A 325F2 Physical Unclonable Function Based on Contact Failure Probability With Bit Error Rate < 0.43 ppm After Preselection With 0.0177% Discard Ratio.
%U http://dblp.uni-trier.de/db/journals/jssc/jssc58.html#JeonLKC23
%V 58
@article{journals/jssc/JeonLKC23,
added-at = {2023-04-16T00:00:00.000+0200},
author = {Jeon, Duhyun and Lee, Dongmin and Kim, Dong Kyue and Choi, Byong-Deok},
biburl = {https://www.bibsonomy.org/bibtex/2b808370039220cfa7eb3e2a058aaf763/dblp},
ee = {https://doi.org/10.1109/JSSC.2022.3189351},
interhash = {9c945940aced19d6c4dce9aac678fede},
intrahash = {b808370039220cfa7eb3e2a058aaf763},
journal = {IEEE J. Solid State Circuits},
keywords = {dblp},
number = 4,
pages = {1185-1196},
timestamp = {2024-04-08T10:42:35.000+0200},
title = {A 325F2 Physical Unclonable Function Based on Contact Failure Probability With Bit Error Rate < 0.43 ppm After Preselection With 0.0177% Discard Ratio.},
url = {http://dblp.uni-trier.de/db/journals/jssc/jssc58.html#JeonLKC23},
volume = 58,
year = 2023
}