%0 Journal Article %1 journals/mr/YazdiSWN16 %A Yazdi, M. Baghaie %A Schmeidl, M. %A Wu, X. %A Neyer, T. %D 2016 %J Microelectron. Reliab. %K dblp %P 74-78 %T A concise study of neutron irradiation effects on power MOSFETs and IGBTs. %U http://dblp.uni-trier.de/db/journals/mr/mr62.html#YazdiSWN16 %V 62

@article{journals/mr/YazdiSWN16, added-at = {2020-02-22T00:00:00.000+0100}, author = {Yazdi, M. Baghaie and Schmeidl, M. and Wu, X. and Neyer, T.}, biburl = {https://www.bibsonomy.org/bibtex/298549fa2c0986392942006c320248e24/dblp}, ee = {https://doi.org/10.1016/j.microrel.2016.03.027}, interhash = {19cb24658bd9523e7f6f48aa5251acc0}, intrahash = {98549fa2c0986392942006c320248e24}, journal = {Microelectron. Reliab.}, keywords = {dblp}, pages = {74-78}, timestamp = {2020-02-25T13:27:17.000+0100}, title = {A concise study of neutron irradiation effects on power MOSFETs and IGBTs.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr62.html#YazdiSWN16}, volume = 62, year = 2016 }