%0 Journal Article %1 journals/mr/MaHDMZWHZ12 %A Ma, Fei %A Han, Yan %A Dong, Shurong %A Miao, Meng %A Zheng, Jianfeng %A Wu, Jian %A gong Han, Cheng %A Zhu, Kehan %D 2012 %J Microelectron. Reliab. %K dblp %N 8 %P 1640-1644 %T Investigation of ESD protection strategy in high voltage Bipolar-CMOS-DMOS process. %U http://dblp.uni-trier.de/db/journals/mr/mr52.html#MaHDMZWHZ12 %V 52

@article{journals/mr/MaHDMZWHZ12, added-at = {2020-02-22T00:00:00.000+0100}, author = {Ma, Fei and Han, Yan and Dong, Shurong and Miao, Meng and Zheng, Jianfeng and Wu, Jian and gong Han, Cheng and Zhu, Kehan}, biburl = {https://www.bibsonomy.org/bibtex/27a7a9d6855249a83f8157c2b6f4be3b0/dblp}, ee = {https://doi.org/10.1016/j.microrel.2011.11.011}, interhash = {9cbc3c0e3f463467345912cd24c8312a}, intrahash = {7a7a9d6855249a83f8157c2b6f4be3b0}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 8, pages = {1640-1644}, timestamp = {2020-02-25T13:30:02.000+0100}, title = {Investigation of ESD protection strategy in high voltage Bipolar-CMOS-DMOS process.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr52.html#MaHDMZWHZ12}, volume = 52, year = 2012 }