%0 Conference Paper %1 conf/irps/ZhuHCZYZZMH18 %A Zhu, Jiejie %A Hou, Bin %A Chen, Lixiang %A Zhu, Qing %A Yang, Ling %A Zhou, Xiaowei %A Zhang, Peng %A Ma, Xiaohua %A Hao, Yue %B IRPS %D 2018 %I IEEE %K dblp %P 1 %T Threshold voltage shift and interface/border trapping mechanism in Al2O3/AlGaN/GaN MOS-HEMTs. %U http://dblp.uni-trier.de/db/conf/irps/irps2018.html#ZhuHCZYZZMH18 %@ 978-1-5386-5479-8

@inproceedings{conf/irps/ZhuHCZYZZMH18, added-at = {2024-06-14T00:00:00.000+0200}, author = {Zhu, Jiejie and Hou, Bin and Chen, Lixiang and Zhu, Qing and Yang, Ling and Zhou, Xiaowei and Zhang, Peng and Ma, Xiaohua and Hao, Yue}, biburl = {https://www.bibsonomy.org/bibtex/2160f9a41757d2dbc4b428bcfb0e606d0/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2018}, ee = {https://doi.org/10.1109/IRPS.2018.8353704}, interhash = {9e8a9ed0ba57c055275a509486d1b052}, intrahash = {160f9a41757d2dbc4b428bcfb0e606d0}, isbn = {978-1-5386-5479-8}, keywords = {dblp}, pages = 1, publisher = {IEEE}, timestamp = {2024-06-17T07:48:09.000+0200}, title = {Threshold voltage shift and interface/border trapping mechanism in Al2O3/AlGaN/GaN MOS-HEMTs.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2018.html#ZhuHCZYZZMH18}, year = 2018 }