%0 Journal Article %1 journals/tc/YanHCCHNGW20 %A Yan, Aibin %A Hu, Yuanjie %A Cui, Jie %A Chen, Zhili %A Huang, Zhengfeng %A Ni, Tianming %A Girard, Patrick %A Wen, Xiaoqing %D 2020 %J IEEE Trans. Computers %K dblp %N 6 %P 789-799 %T Information Assurance Through Redundant Design: A Novel TNU Error-Resilient Latch for Harsh Radiation Environment. %U http://dblp.uni-trier.de/db/journals/tc/tc69.html#YanHCCHNGW20 %V 69

@article{journals/tc/YanHCCHNGW20, added-at = {2020-06-16T00:00:00.000+0200}, author = {Yan, Aibin and Hu, Yuanjie and Cui, Jie and Chen, Zhili and Huang, Zhengfeng and Ni, Tianming and Girard, Patrick and Wen, Xiaoqing}, biburl = {https://www.bibsonomy.org/bibtex/2e43822951191fc4c0439c258c7127197/dblp}, ee = {https://doi.org/10.1109/TC.2020.2966200}, interhash = {9ff3b4c49fda4cdbaa671adec0049aca}, intrahash = {e43822951191fc4c0439c258c7127197}, journal = {IEEE Trans. Computers}, keywords = {dblp}, number = 6, pages = {789-799}, timestamp = {2020-06-17T11:45:04.000+0200}, title = {Information Assurance Through Redundant Design: A Novel TNU Error-Resilient Latch for Harsh Radiation Environment.}, url = {http://dblp.uni-trier.de/db/journals/tc/tc69.html#YanHCCHNGW20}, volume = 69, year = 2020 }