%0 Conference Paper %1 conf/3dic/SonedaHYL19 %A Soneda, Hanna %A Hashizume, Masaki %A Yotsuyanagi, Hiroyuki %A Lu, Shyue-Kung %B 3DIC %D 2019 %I IEEE %K dblp %P 1-5 %T Electrical Field Test Method of Resistive Open Defects between Dies by Quiescent Currents through Embedded Diodes. %U http://dblp.uni-trier.de/db/conf/3dic/3dic2019.html#SonedaHYL19 %@ 978-1-7281-4870-0

@inproceedings{conf/3dic/SonedaHYL19, added-at = {2020-04-19T00:00:00.000+0200}, author = {Soneda, Hanna and Hashizume, Masaki and Yotsuyanagi, Hiroyuki and Lu, Shyue-Kung}, biburl = {https://www.bibsonomy.org/bibtex/220d1ddf27b13faf3dcc022eddc41d1be/dblp}, booktitle = {3DIC}, crossref = {conf/3dic/2019}, ee = {https://doi.org/10.1109/3DIC48104.2019.9058777}, interhash = {a148112cd3800f4a7d2563ea06268e92}, intrahash = {20d1ddf27b13faf3dcc022eddc41d1be}, isbn = {978-1-7281-4870-0}, keywords = {dblp}, pages = {1-5}, publisher = {IEEE}, timestamp = {2020-04-21T11:41:02.000+0200}, title = {Electrical Field Test Method of Resistive Open Defects between Dies by Quiescent Currents through Embedded Diodes.}, url = {http://dblp.uni-trier.de/db/conf/3dic/3dic2019.html#SonedaHYL19}, year = 2019 }