%0 Journal Article %1 journals/mr/TyaginovSSGG09 %A Tyaginov, Stanislav %A Sverdlov, Viktor %A Starkov, Ivan A. %A Gös, Wolfgang %A Grasser, Tibor %D 2009 %J Microelectron. Reliab. %K dblp %N 9-11 %P 998-1002 %T Impact of O-Si-O bond angle fluctuations on the Si-O bond-breakage rate. %U http://dblp.uni-trier.de/db/journals/mr/mr49.html#TyaginovSSGG09 %V 49

@article{journals/mr/TyaginovSSGG09, added-at = {2020-02-22T00:00:00.000+0100}, author = {Tyaginov, Stanislav and Sverdlov, Viktor and Starkov, Ivan A. and Gös, Wolfgang and Grasser, Tibor}, biburl = {https://www.bibsonomy.org/bibtex/22f9f17323b9ab13692ad54378ffd6068/dblp}, ee = {https://doi.org/10.1016/j.microrel.2009.06.018}, interhash = {a1f1ea187bfda3af0811d50ee0bb255f}, intrahash = {2f9f17323b9ab13692ad54378ffd6068}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {998-1002}, timestamp = {2020-02-25T13:27:32.000+0100}, title = {Impact of O-Si-O bond angle fluctuations on the Si-O bond-breakage rate.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr49.html#TyaginovSSGG09}, volume = 49, year = 2009 }