%0 Conference Paper %1 conf/iscas/MiuraNK94 %A Miura, Yukiya %A Naito, Sachio %A Kinoshita, Kozo %B ISCAS %D 1994 %I IEEE %K dblp %P 77-80 %T A Case Study of Mixed-Signal Integrated Circuit Testing: An Application of Current Testing Using the Upper Limit and the Lower Limit. %U http://dblp.uni-trier.de/db/conf/iscas/iscas1994-5.html#MiuraNK94 %@ 0-7803-1916-8

@inproceedings{conf/iscas/MiuraNK94, added-at = {2016-05-23T00:00:00.000+0200}, author = {Miura, Yukiya and Naito, Sachio and Kinoshita, Kozo}, biburl = {https://www.bibsonomy.org/bibtex/20fcf590fb9b982b6e095401180077339/dblp}, booktitle = {ISCAS}, crossref = {conf/iscas/1994}, ee = {http://dx.doi.org/10.1109/ISCAS.1994.409304}, interhash = {a630980ec2f909e2f34b2efe564e59bf}, intrahash = {0fcf590fb9b982b6e095401180077339}, isbn = {0-7803-1916-8}, keywords = {dblp}, pages = {77-80}, publisher = {IEEE}, timestamp = {2016-05-24T11:51:44.000+0200}, title = {A Case Study of Mixed-Signal Integrated Circuit Testing: An Application of Current Testing Using the Upper Limit and the Lower Limit.}, url = {http://dblp.uni-trier.de/db/conf/iscas/iscas1994-5.html#MiuraNK94}, year = 1994 }