%0 Conference Paper %1 conf/irps/PuschkarskyGAGR18 %A Puschkarsky, Katja %A Grasser, Tibor %A Aichinger, Thomas %A Gustin, Wolfgang %A Reisinger, Hans %B IRPS %D 2018 %I IEEE %K dblp %P 3 %T Understanding and modeling transient threshold voltage instabilities in SiC MOSFETs. %U http://dblp.uni-trier.de/db/conf/irps/irps2018.html#PuschkarskyGAGR18 %@ 978-1-5386-5479-8

@inproceedings{conf/irps/PuschkarskyGAGR18, added-at = {2019-10-19T00:00:00.000+0200}, author = {Puschkarsky, Katja and Grasser, Tibor and Aichinger, Thomas and Gustin, Wolfgang and Reisinger, Hans}, biburl = {https://www.bibsonomy.org/bibtex/25cc756172cd4aeb06b23e9b93ba75261/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2018}, ee = {https://doi.org/10.1109/IRPS.2018.8353560}, interhash = {a7cdd46b58df57fa76375a1790ee8fad}, intrahash = {5cc756172cd4aeb06b23e9b93ba75261}, isbn = {978-1-5386-5479-8}, keywords = {dblp}, pages = 3, publisher = {IEEE}, timestamp = {2019-10-22T14:41:41.000+0200}, title = {Understanding and modeling transient threshold voltage instabilities in SiC MOSFETs.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2018.html#PuschkarskyGAGR18}, year = 2018 }