%0 Journal Article %1 journals/tcom/ClarkLG81 %A Clark, James A. %A Lee, Bob %A Gargiulo, Joseph L. %D 1981 %J IEEE Trans. Commun. %K dblp %N 10 %P 1419-1428 %T Loop Test System: A New Maintenance Feature for the Distributed Integrated Digital Network. %U http://dblp.uni-trier.de/db/journals/tcom/tcom29.html#ClarkLG81 %V 29

@article{journals/tcom/ClarkLG81, added-at = {2020-09-01T00:00:00.000+0200}, author = {Clark, James A. and Lee, Bob and Gargiulo, Joseph L.}, biburl = {https://www.bibsonomy.org/bibtex/2f87a3d211f50f09ac5b131a62bade9b8/dblp}, ee = {https://doi.org/10.1109/TCOM.1981.1094896}, interhash = {ae8c9fd7c83d028a03942adc8f8f1e99}, intrahash = {f87a3d211f50f09ac5b131a62bade9b8}, journal = {IEEE Trans. Commun.}, keywords = {dblp}, number = 10, pages = {1419-1428}, timestamp = {2020-09-09T13:14:21.000+0200}, title = {Loop Test System: A New Maintenance Feature for the Distributed Integrated Digital Network.}, url = {http://dblp.uni-trier.de/db/journals/tcom/tcom29.html#ClarkLG81}, volume = 29, year = 1981 }