%0 Conference Paper %1 conf/vts/Ciciani91 %A Ciciani, Bruno %B VTS %D 1991 %I IEEE Computer Society %K dblp %P 143-148 %T Modeling the effects of imperfect production testing on reconfigurable VLSI chips. %U http://dblp.uni-trier.de/db/conf/vts/vts1991.html#Ciciani91

@inproceedings{conf/vts/Ciciani91, added-at = {2023-03-24T00:00:00.000+0100}, author = {Ciciani, Bruno}, biburl = {https://www.bibsonomy.org/bibtex/2ed6517e2d0cbd70e7b185dd9978641eb/dblp}, booktitle = {VTS}, crossref = {conf/vts/1991}, ee = {https://doi.ieeecomputersociety.org/10.1109/VTEST.1991.208149}, interhash = {b00d40fcf512d40b44c05e62512f09ee}, intrahash = {ed6517e2d0cbd70e7b185dd9978641eb}, keywords = {dblp}, pages = {143-148}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T07:35:10.000+0200}, title = {Modeling the effects of imperfect production testing on reconfigurable VLSI chips.}, url = {http://dblp.uni-trier.de/db/conf/vts/vts1991.html#Ciciani91}, year = 1991 }