%0 Conference Paper %1 conf/irps/HauserSVKGBPM22 %A Hauser, M. %A Srinivasan, P. %A Vallett, A. %A Krishnasamy, R. %A Guarin, Fernando %A Brochu, Dave %A Pham, V. %A Min, Byoung %B IRPS %D 2022 %I IEEE %K dblp %P 5 %T Parasitic Drain Series Resistance Effects on Non-conducting Hot Carrier Reliability. %U http://dblp.uni-trier.de/db/conf/irps/irps2022.html#HauserSVKGBPM22 %@ 978-1-6654-7950-9

@inproceedings{conf/irps/HauserSVKGBPM22, added-at = {2022-05-09T00:00:00.000+0200}, author = {Hauser, M. and Srinivasan, P. and Vallett, A. and Krishnasamy, R. and Guarin, Fernando and Brochu, Dave and Pham, V. and Min, Byoung}, biburl = {https://www.bibsonomy.org/bibtex/2489912763f0dd414d4762d263c3f2f1a/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2022}, ee = {https://doi.org/10.1109/IRPS48227.2022.9764575}, interhash = {b048172f90d47cddfad219d3c4e9a502}, intrahash = {489912763f0dd414d4762d263c3f2f1a}, isbn = {978-1-6654-7950-9}, keywords = {dblp}, pages = 5, publisher = {IEEE}, timestamp = {2024-04-09T12:18:58.000+0200}, title = {Parasitic Drain Series Resistance Effects on Non-conducting Hot Carrier Reliability.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2022.html#HauserSVKGBPM22}, year = 2022 }