%0 Conference Paper %1 conf/iccad/SukharevHCT14 %A Sukharev, Valeriy %A Huang, Xin %A Chen, Hai-Bao %A Tan, Sheldon X.-D. %B ICCAD %D 2014 %E Chang, Yao-Wen %I IEEE %K dblp %P 428-433 %T IR-drop based electromigration assessment: parametric failure chip-scale analysis. %U http://dblp.uni-trier.de/db/conf/iccad/iccad2014.html#SukharevHCT14 %@ 978-1-4799-6277-8

@inproceedings{conf/iccad/SukharevHCT14, added-at = {2019-06-02T00:00:00.000+0200}, author = {Sukharev, Valeriy and Huang, Xin and Chen, Hai-Bao and Tan, Sheldon X.-D.}, biburl = {https://www.bibsonomy.org/bibtex/2b17ab9d789933955a98e01984634f6b6/dblp}, booktitle = {ICCAD}, crossref = {conf/iccad/2014}, editor = {Chang, Yao-Wen}, ee = {https://www.wikidata.org/entity/Q60154755}, interhash = {b0acde72248b5547232b364a7cf203be}, intrahash = {b17ab9d789933955a98e01984634f6b6}, isbn = {978-1-4799-6277-8}, keywords = {dblp}, pages = {428-433}, publisher = {IEEE}, timestamp = {2019-10-17T22:45:06.000+0200}, title = {IR-drop based electromigration assessment: parametric failure chip-scale analysis.}, url = {http://dblp.uni-trier.de/db/conf/iccad/iccad2014.html#SukharevHCT14}, year = 2014 }