%0 Conference Paper %1 conf/icsrs/TruongDMI19 %A Truong, Minh-Tuan %A Do, Phuc %A Mendizabal, Laurent %A Iung, Benoît %B ICSRS %D 2019 %I IEEE %K dblp %P 218-223 %T Reliability Assessment of Optoelectronic Systems with Stochastic Interactions under Accelerated Degradation Testing. %U http://dblp.uni-trier.de/db/conf/icsrs/icsrs2019.html#TruongDMI19 %@ 978-1-7281-4781-9

@inproceedings{conf/icsrs/TruongDMI19, added-at = {2022-11-08T00:00:00.000+0100}, author = {Truong, Minh-Tuan and Do, Phuc and Mendizabal, Laurent and Iung, Benoît}, biburl = {https://www.bibsonomy.org/bibtex/2bfda7848322a4e99af4d135bdb141222/dblp}, booktitle = {ICSRS}, crossref = {conf/icsrs/2019}, ee = {https://doi.org/10.1109/ICSRS48664.2019.8987697}, interhash = {b247c2930d692874dc057e399d9797b7}, intrahash = {bfda7848322a4e99af4d135bdb141222}, isbn = {978-1-7281-4781-9}, keywords = {dblp}, pages = {218-223}, publisher = {IEEE}, timestamp = {2024-04-09T19:05:55.000+0200}, title = {Reliability Assessment of Optoelectronic Systems with Stochastic Interactions under Accelerated Degradation Testing.}, url = {http://dblp.uni-trier.de/db/conf/icsrs/icsrs2019.html#TruongDMI19}, year = 2019 }