%0 Conference Paper %1 conf/ism2/TheodosiouRPTPD23 %A Theodosiou, Theodosis %A Rapti, Aikaterini %A Papageorgiou, Konstantinos %A Tziolas, Theodoros %A Papageorgiou, Elpiniki %A Dimitriou, Nikolaos %A Margetis, George %A Tzovaras, Dimitrios %B ISM %D 2023 %E Longo, Francesco %E Affenzeller, Michael %E Padovano, Antonio %E Shen, Weiming %I Elsevier %K dblp %P 570-583 %T A Review Study on ML-based Methods for Defect-Pattern Recognition in Wafer Maps. %U http://dblp.uni-trier.de/db/conf/ism2/ism2023.html#TheodosiouRPTPD23 %V 217

@inproceedings{conf/ism2/TheodosiouRPTPD23, added-at = {2024-02-05T00:00:00.000+0100}, author = {Theodosiou, Theodosis and Rapti, Aikaterini and Papageorgiou, Konstantinos and Tziolas, Theodoros and Papageorgiou, Elpiniki and Dimitriou, Nikolaos and Margetis, George and Tzovaras, Dimitrios}, biburl = {https://www.bibsonomy.org/bibtex/2b8681bec5f1c185ac378a279cd109554/dblp}, booktitle = {ISM}, crossref = {conf/ism2/2023}, editor = {Longo, Francesco and Affenzeller, Michael and Padovano, Antonio and Shen, Weiming}, ee = {https://doi.org/10.1016/j.procs.2022.12.253}, interhash = {b463ab445beef644130d365f421166f3}, intrahash = {b8681bec5f1c185ac378a279cd109554}, keywords = {dblp}, pages = {570-583}, publisher = {Elsevier}, series = {Procedia Computer Science}, timestamp = {2024-04-09T18:48:06.000+0200}, title = {A Review Study on ML-based Methods for Defect-Pattern Recognition in Wafer Maps.}, url = {http://dblp.uni-trier.de/db/conf/ism2/ism2023.html#TheodosiouRPTPD23}, volume = 217, year = 2023 }