%0 Conference Paper %1 conf/iccad/SunL14 %A Sun, Shupeng %A Li, Xin %B ICCAD %D 2014 %E Chang, Yao-Wen %I IEEE %K dblp %P 324-331 %T Fast statistical analysis of rare circuit failure events via subset simulation in high-dimensional variation space. %U http://dblp.uni-trier.de/db/conf/iccad/iccad2014.html#SunL14 %@ 978-1-4799-6277-8

@inproceedings{conf/iccad/SunL14, added-at = {2017-05-24T00:00:00.000+0200}, author = {Sun, Shupeng and Li, Xin}, biburl = {https://www.bibsonomy.org/bibtex/2223872ee3064ce0def5f7fe0cf993000/dblp}, booktitle = {ICCAD}, crossref = {conf/iccad/2014}, editor = {Chang, Yao-Wen}, ee = {http://dl.acm.org/citation.cfm?id=2691430}, interhash = {b696ec5a371928ff7b227e92ecdbad3e}, intrahash = {223872ee3064ce0def5f7fe0cf993000}, isbn = {978-1-4799-6277-8}, keywords = {dblp}, pages = {324-331}, publisher = {IEEE}, timestamp = {2019-10-17T22:45:06.000+0200}, title = {Fast statistical analysis of rare circuit failure events via subset simulation in high-dimensional variation space.}, url = {http://dblp.uni-trier.de/db/conf/iccad/iccad2014.html#SunL14}, year = 2014 }