%0 Journal Article %1 journals/et/BhowmikBDB19 %A Bhowmik, Biswajit %A Biswas, Santosh %A Deka, Jatindra Kumar %A Bhattacharya, Bhargab B. %D 2019 %J J. Electron. Test. %K dblp %N 2 %P 215-243 %T A Low-Cost Test Solution for Reliable Communication in Networks-on-Chip. %U http://dblp.uni-trier.de/db/journals/et/et35.html#BhowmikBDB19 %V 35

@article{journals/et/BhowmikBDB19, added-at = {2020-09-11T00:00:00.000+0200}, author = {Bhowmik, Biswajit and Biswas, Santosh and Deka, Jatindra Kumar and Bhattacharya, Bhargab B.}, biburl = {https://www.bibsonomy.org/bibtex/2db800880e94455d0dd49eda1b08ce909/dblp}, ee = {https://doi.org/10.1007/s10836-019-05792-1}, interhash = {bad7cfce5c75b645a019ccf3e2161259}, intrahash = {db800880e94455d0dd49eda1b08ce909}, journal = {J. Electron. Test.}, keywords = {dblp}, number = 2, pages = {215-243}, timestamp = {2020-09-12T11:40:15.000+0200}, title = {A Low-Cost Test Solution for Reliable Communication in Networks-on-Chip.}, url = {http://dblp.uni-trier.de/db/journals/et/et35.html#BhowmikBDB19}, volume = 35, year = 2019 }