%0 Journal Article %1 journals/tie/GuzmanBD15 %A Guzman, Hugo %A Barrero, Federico %A Durán, Mario J. %D 2015 %J IEEE Trans. Ind. Electron. %K dblp %N 1 %P 15-20 %T IGBT-Gating Failure Effect on a Fault-Tolerant Predictive Current-Controlled Five-Phase Induction Motor Drive. %U http://dblp.uni-trier.de/db/journals/tie/tie62.html#GuzmanBD15 %V 62

@article{journals/tie/GuzmanBD15, added-at = {2020-05-22T00:00:00.000+0200}, author = {Guzman, Hugo and Barrero, Federico and Durán, Mario J.}, biburl = {https://www.bibsonomy.org/bibtex/2d5a21b8108f8b6a971d1ec4303a4c926/dblp}, ee = {https://doi.org/10.1109/TIE.2014.2331019}, interhash = {bba07c26b22e3abcb0f86f5ccc9a0646}, intrahash = {d5a21b8108f8b6a971d1ec4303a4c926}, journal = {IEEE Trans. Ind. Electron.}, keywords = {dblp}, number = 1, pages = {15-20}, timestamp = {2020-05-23T11:44:55.000+0200}, title = {IGBT-Gating Failure Effect on a Fault-Tolerant Predictive Current-Controlled Five-Phase Induction Motor Drive.}, url = {http://dblp.uni-trier.de/db/journals/tie/tie62.html#GuzmanBD15}, volume = 62, year = 2015 }