%0 Journal Article %1 journals/mj/DuboisKHB09 %A Dubois, Benoit %A Kammerer, Jean-Baptiste %A Hébrard, Luc %A Braun, Francis %D 2009 %J Microelectron. J. %K dblp %N 9 %P 1274-1280 %T Modelling of hot-carrier degradation and its application for analog design for reliability. %U http://dblp.uni-trier.de/db/journals/mj/mj40.html#DuboisKHB09 %V 40

@article{journals/mj/DuboisKHB09, added-at = {2020-02-22T00:00:00.000+0100}, author = {Dubois, Benoit and Kammerer, Jean-Baptiste and Hébrard, Luc and Braun, Francis}, biburl = {https://www.bibsonomy.org/bibtex/2dc9f64f73a20dd763750ad6cefeb942e/dblp}, ee = {https://doi.org/10.1016/j.mejo.2008.03.017}, interhash = {1bca198a5798a096cec686ef71593f6f}, intrahash = {dc9f64f73a20dd763750ad6cefeb942e}, journal = {Microelectron. J.}, keywords = {dblp}, number = 9, pages = {1274-1280}, timestamp = {2020-02-25T13:01:33.000+0100}, title = {Modelling of hot-carrier degradation and its application for analog design for reliability.}, url = {http://dblp.uni-trier.de/db/journals/mj/mj40.html#DuboisKHB09}, volume = 40, year = 2009 }