%0 Journal Article %1 journals/tecs/NieWZ21 %A Nie, Shiqiang %A Wu, Weiguo %A Zhang, Chi %D 2021 %J ACM Trans. Embed. Comput. Syst. %K dblp %N 5s %P 69:1-69:20 %T Data Pattern Aware Reliability Enhancement Scheme for 3D Solid-State Drives. %U http://dblp.uni-trier.de/db/journals/tecs/tecs20.html#NieWZ21 %V 20

@article{journals/tecs/NieWZ21, added-at = {2021-11-26T00:00:00.000+0100}, author = {Nie, Shiqiang and Wu, Weiguo and Zhang, Chi}, biburl = {https://www.bibsonomy.org/bibtex/244f1deed1153be81df4c7ee50afc0fd7/dblp}, ee = {https://doi.org/10.1145/3477000}, interhash = {bd40ccfc4fb22494517754d93265d352}, intrahash = {44f1deed1153be81df4c7ee50afc0fd7}, journal = {ACM Trans. Embed. Comput. Syst.}, keywords = {dblp}, number = {5s}, pages = {69:1-69:20}, timestamp = {2024-04-08T20:55:16.000+0200}, title = {Data Pattern Aware Reliability Enhancement Scheme for 3D Solid-State Drives.}, url = {http://dblp.uni-trier.de/db/journals/tecs/tecs20.html#NieWZ21}, volume = 20, year = 2021 }