%0 Journal Article %1 journals/mr/SmithHGSLW16 %A Smith, K. V. %A Haller, J. %A Guerrero, Josep M. %A Smith, R. P. %A Lal, R. %A Wu, YiFeng %D 2016 %J Microelectron. Reliab. %K dblp %P 197-203 %T Lifetime tests of 600-V GaN-on-Si power switches and HEMTs. %U http://dblp.uni-trier.de/db/journals/mr/mr58.html#SmithHGSLW16 %V 58

@article{journals/mr/SmithHGSLW16, added-at = {2020-02-22T00:00:00.000+0100}, author = {Smith, K. V. and Haller, J. and Guerrero, Josep M. and Smith, R. P. and Lal, R. and Wu, YiFeng}, biburl = {https://www.bibsonomy.org/bibtex/2d9ebae38a58edabeb44156e6edf5ac77/dblp}, ee = {https://www.wikidata.org/entity/Q61733947}, interhash = {bd4ae3522a3f0dd1a9944d8790140e1d}, intrahash = {d9ebae38a58edabeb44156e6edf5ac77}, journal = {Microelectron. Reliab.}, keywords = {dblp}, pages = {197-203}, timestamp = {2020-02-25T13:22:27.000+0100}, title = {Lifetime tests of 600-V GaN-on-Si power switches and HEMTs.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr58.html#SmithHGSLW16}, volume = 58, year = 2016 }