%0 Conference Paper %1 conf/iciis/KunduCM08 %A Kundu, Subhadip %A Chattopadhyay, Santanu %A Manna, Kanchan %B ICIIS %D 2008 %I IEEE %K dblp %P 1-6 %T A Novel Technique to Reduce both Leakage and Peak Power during Scan Testing. %U http://dblp.uni-trier.de/db/conf/iciis/iciis2008.html#KunduCM08

@inproceedings{conf/iciis/KunduCM08, added-at = {2021-08-12T00:00:00.000+0200}, author = {Kundu, Subhadip and Chattopadhyay, Santanu and Manna, Kanchan}, biburl = {https://www.bibsonomy.org/bibtex/269c69ba98f4ced9a2f9b059f557bce90/dblp}, booktitle = {ICIIS}, crossref = {conf/iciis/2008}, ee = {https://doi.org/10.1109/ICIINFS.2008.4798402}, interhash = {bf2be7e1bb5da846d5d7e98ac49e94b4}, intrahash = {69c69ba98f4ced9a2f9b059f557bce90}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE}, timestamp = {2024-04-09T15:35:44.000+0200}, title = {A Novel Technique to Reduce both Leakage and Peak Power during Scan Testing.}, url = {http://dblp.uni-trier.de/db/conf/iciis/iciis2008.html#KunduCM08}, year = 2008 }